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AE Techron 3110A: Automated EMC Testing up to 1 MHz
AE Techron 3110A: Automated EMC Testing up to 1 MHz
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The AE Techron 3110A automates low-frequency EMC testing from DC to 1 MHz with more than 3,700 integrated automotive...

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AE Techron 3110A: Automated EMC Testing up to 1 MHz

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Automated low-frequency EMC testing with the AE Techron 3110A

Complex EMC testing requires not only accurate signal generation, but also the reliable and repeatable execution of extensive test sequences. The AE Techron 3110A standards waveform generator is designed to support this type of requirement in automotive and industrial test environments.

The 3110A combines flexible waveform generation with a library of more than 3,700 tests based on automotive and industrial standards. Existing tests can be edited and users can also create their own test sequences.

From DC to 1 MHz for demanding EMC test sequences

The AE Techron 3110A operates over a frequency range from DC to 1 MHz and provides a rise time of 3 µs across the full measurement range. Test waveforms can have durations ranging from 50 ms to several months.

Key specified features include:

  • Frequency range from DC to 1 MHz
  • 3 µs rise time across the full measurement range
  • Test waveform durations from 50 ms to several months
  • Frequency resolution of 0.01 Hz or better
  • Amplitude resolution of 76 µV
  • Control via GPIO or LAN trigger
  • Remote operation via client software

AE Techron 3110A standards waveform generator for low-frequency EMC testing

Flexible waveforms and configurable segments

One of the key strengths of the 3110A is the flexible configuration of the individual waveform segments used to build a test sequence. Each segment can use its own waveform, including sine, square and triangle waveforms as well as DC offsets.

Frequency, amplitude and DC offset can be configured as fixed, variable or limited values, or set as a sweep. Segments can also be calibrated, for example as required for CS101, and can wait for an external trigger before moving to the next segment.

Automating complex test sequences

The full potential of the system becomes apparent when multiple waveform segments are combined into complete test sequences. These sequences can be configured to run for extended periods and can be executed once or repeatedly in a loop.

Several variables can also change during the same sequence. According to AE Techron, this functionality is particularly relevant for complex automotive test procedures such as those required by various Toyota and GM standards.

These automation functions help make repetitive and time-consuming test procedures more reproducible while reducing the amount of manual intervention required in the laboratory.

More than 3,700 integrated automotive and industrial tests

The 3110A includes more than 3,700 tests based on automotive and industrial standards. AE Techron also provides free lifetime updates to the integrated standards library.

This test library helps users set up standards-based test procedures more efficiently while retaining the flexibility to modify existing tests or create entirely new test sequences for specific requirements.

Combining the 3110A with the AE Techron 7234 amplifier

For applications that also require power amplification, the 3110A can be combined with the AE Techron Model 7234 amplifier.

According to AE Techron, this combination can generate practically all waveforms required for EMC testing, including DC offsets, dropouts and surges, with rise and fall times of 2 µs or greater and frequencies from DC to 1 MHz.

The 3110A can therefore provide the basis for flexible and automated low-frequency EMC test setups combining waveform generation, sequence control and power amplification.

EMCO Elektronik as your contact for AE Techron solutions

EMCO Elektronik GmbH is the local contact for AE Techron products in Germany and Austria.

With expertise in EMC measurement technology and complex test systems, EMCO supports customers in the technical selection of suitable components and in defining solutions for laboratory, development and test applications.