Make MV/m E-Field Assessment a Child’s Play – with Kapteos Optical Probes

Measuring local electric fields in high-voltage environments has long been a challenge, particularly when dealing with field strengths in the MV/m range. Thanks to Kapteos electro-optic E-field probes, engineers can now achieve comprehensive, interference-free measurements with millimetric spatial resolution.

Experimental setup and results

Using a classical setup with a grounded plane and a 30 mm radius sphere connected to a tunable high-voltage transformer, measurements were performed at RMS field strengths up to 1 MV/m. Multiple probe positions were defined according to electromagnetic simulations, enabling precise field mapping. The second harmonic and ten odd harmonics (up to the 23rd) were identified and fully characterized.

High precision and dielectric integrity

Kapteos E-field probes are fully dielectric and interference-free, allowing reliable field mapping without disturbing the electric field. Such measurements can be performed within minutes, even in high-voltage environments, with millimeter accuracy.

Key benefits

• Non-invasive measurement – no field distortion
• Full dielectric design – immune to electromagnetic interference
• Measurement range up to 1 MV/m RMS
• Millimeter-level spatial resolution
• Harmonic analysis up to the 23rd order

Simulation-driven calibration

To complement experimental data, electromagnetic simulations were carried out to model the E-field distribution between the grounded plane and the sphere. This ensured consistent calibration and accurate comparison between measured and simulated results.

Local partnership

EMCO Elektronik GmbH is the official representative of Kapteos in Germany, Austria and Switzerland, offering full support for the integration and application of Kapteos optical high-voltage measurement systems.

Special News 14/2024 – Kapteos E-Field Measurement in the MV/m Range